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Electric Field-assisted Polishing Using Electrophoresis Phenomenon (2nd Report): Polishing of Silicon Nitride under Applied Load

机译:电场辅助抛光电泳现象(第2报告):应用载荷下氮化硅的抛光

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摘要

Polishing of silicon nitride has been conducted by using a newly-developed finishing setup which is able to give the polishing pressure to the workpiece. The polishing is made by using an electrophoresis phenomenon of fine grain in liquid. When the electric power of DC voltage is supplied to the electrode set into the polishing compound, the grain moves and causes the polishing action to the workpiece surface. The polishing pad is put onto the stainless disc electrode. It is found from the experiments that unwoven polishing pad and reddish ferrite grain are suitable for the finishing of silicon nitride. Experimental results show that the stock removal rate increases with both the applied potential and load. The characteristics of surface polished are examined by X-ray photo spectroscopy. Photo electron spectra observed suggest that the mechanochemical actions arise on the surface of silicon nitride during the polishing process.
机译:氮化硅的抛光是通过使用新开发的精加工装置进行的,该精加工装置能够向工件施加抛光压力。利用液体中细颗粒的电泳现象进行抛光。当将直流电压的电力提供给设置在抛光剂中的电极时,晶粒移动并引起对工件表面的抛光作用。将抛光垫放在不锈钢圆盘电极上。从实验中发现,非织造抛光垫和带红色的铁素体晶粒适合于氮化硅的精加工。实验结果表明,除铁率随施加的电势和负荷而增加。通过X射线光谱检查表面抛光的特性。观察到的光电子光谱表明,在抛光过程中,机械化学作用出现在氮化硅的表面上。

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